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Event(s) on November 2010
- 4/11/2010
| 題目: |
CMIV DL: Image Processing and Computational Intelligence Methods for Computer-assisted Skin Cancer Diagnosis |
| 講員: |
Prof. Maciej J. Ogorzalek, Jagiellonian University Krakow, Poland |
| 時間/地點: |
17:00 - 18:00 (Preceded by Tea Reception at 4:30 pm)
RRS905, Sir Run Run Shaw Building, HSH Campus, Hong Kong Baptist University
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| 摘要: |
Digital photography provides powerful tools for computer-assisted
diagnosis systems
in dermatology. Dermoscopy is a special photography technique
which enable taking
photos of skin lesions in chosen lighting conditions. Computer-assisted
techniques and
image processing methods are used for feature extraction and
pattern recognition in the
selected images. Special techniques used in skin-image processing
are discussed in
detail. Feature extraction and classification techniques based
on statistical learning
and model ensembling techniques provide very powerful tools
which can assist the
doctors in taking decisions. Performance of classifiers will
be discussed in specific
case of melanoma cancer diagnosis. The techniques have been
tested on a large data set
of images.
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- 22/11/2010
| 題目: |
Efficient Numerical Methods for Stochastic Maxwell Equations and Applications in Spectrometer Design |
| 講員: |
Prof. ZHOU Haomin, School of Mathematics, Georgia Institute of Technology, USA |
| 時間/地點: |
11:00 - 12:00
FSC1217, Fong Shu Chuen Library, HSH Campus, Hong Kong Baptist University
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| 摘要: |
In this presentation, we present a stochastic model for general
spatially incoherent sources with applications in photonic crystal.
The model naturally incorporates the incoherent property and
leads to stochastic Maxwell equations. We also propose a fast
numerical method based on Wiener Chaos Expansions (WCE), which
convert the random equations into coupled system of deterministic
equations, so that they can be solved using efficient deterministic
methods. In the applications of photonic crystal, the new methods
can achieve 2 order of magnitude faster computation time over
the standard method.
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